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Patent Searching and Data


Title:
PROBING APPARATUS
Document Type and Number:
Japanese Patent JPH04350578
Kind Code:
A
Abstract:

PURPOSE: To realize the title apparatus markedly enhanced in its function constituted so as to be mounted on a printed circuit board tester bringing a pair of probes into contact with a printed circuit board to inspect continuity or to measure a resistance value.

CONSTITUTION: In the probing apparatus mounted on a printed circuit board tester bringing probes 1 into contact with the wiring pattern 61 of a printed circuit board 60 to inspect continuity or to measure a resistance value, the probe holder 10 held to a probe guiding mechanism 5 provided so as to be positionally movable in a horizontal direction to move up and down, the shaking lever 3 supported in a shakable manner by the probe holder 10, the displacement detection sensor 7 having the probes 1 at one end part thereof and also having an equilibrium wt. at the other end part thereof to detect the posture change of the shaking lever and a control part 50 controlling the operation of a motor 30 driving the probe holder 10 in a vertical direction by the signal from the displacement detection sensor 7 are mounted. The position of the probe 10 in a vertical direction is controlled corresponding to the posture of the shaking lever 3.


Inventors:
FUKUDA TAKASHI
Application Number:
JP12355791A
Publication Date:
December 04, 1992
Filing Date:
May 28, 1991
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G01R1/067; G01R1/073; G01R27/02; G01R31/02; G01R31/28; G01R1/06; (IPC1-7): G01R1/06; G01R1/067; G01R1/073; G01R27/02; G01R31/02; G01R31/28
Attorney, Agent or Firm:
Sadaichi Igita