Title:
QUADRUPOLE ION TRAP METHOD PROVIDED WITH IMPROVED SENSITIVITY
Document Type and Number:
Japanese Patent JPH06203792
Kind Code:
A
Abstract:
PURPOSE: To perform the more effective release and storage of ion by utilizing the reverse mass relation of restoring force in quadrupole ion trap(QIT). CONSTITUTION: A sample to be analyzed is introduced through a tube 6. An electron from an electron ionizing source 3 is collided with the gas within a space 10 under the control of a computer 15 to separate the gas to ion, neutral particle and charged particle group. The computer 15 controls a RF generator 16 through a connector 22, a waveform generator I13 and a waveform generator II14. The ion to be studied is made unstable during the scanning of RF trapping voltage, and then collected by an ion multiple detector 4. The detector 4 imparts a data to the computer 15 through a preamplifier 17 in order to generate the spectrum of the ion to be studied.
Inventors:
SHIDONII II BATORIRU JIYUNIA
Application Number:
JP20692093A
Publication Date:
July 22, 1994
Filing Date:
July 30, 1993
Export Citation:
Assignee:
VARIAN ASSOCIATES
International Classes:
H01J49/42; (IPC1-7): H01J49/42
Attorney, Agent or Firm:
Sumio Takeuchi (2 outside)
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