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Patent Searching and Data


Title:
REFLECTANCE MEASURING DEVICE AND REFLECTANCE MEASURING METHOD
Document Type and Number:
Japanese Patent JPH07286958
Kind Code:
A
Abstract:

PURPOSE: To measure at a high accuracy even though the measuring surface forms of a work to measure and a standard sample are different, by regulating the sample measuring position and the measuring surface of the work to measure coincide constantly.

CONSTITUTION: The light radiated on a sample measuring position 3 by a fiber 2 for projection is reflected by a work to measure at the position 3, and the quantity of light of the received light by a fiber 4 for receiving is measured by a spectroscope or the like. In this case a movable attachment 7 maintains the fibers 2 and 4 at a constant angle in a holder 11, and the parts contacting with the work to measure are expanded and contracted. By regulating the expansion distance L by a regulating handle 8 through the combination of gears, for example, the distance between the fibers 2 and 4 maintained at a constant angle, and the measuring surface of the work to measure is regulated. Consequently, even when the form of the measuring surface of a work to measure is different from the form of the measuring surface of a standard sample, the absolute reflectance of the measured surface can be measured at a high accuracy.


Inventors:
KAMEDA HIROYUKI
MIZUNO OSAMU
Application Number:
JP10151994A
Publication Date:
October 31, 1995
Filing Date:
April 15, 1994
Export Citation:
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Assignee:
USHIO ELECTRIC INC
International Classes:
G01N21/55; (IPC1-7): G01N21/55