To perform total inspection in a noncontact and nondestructive way by a comparatively inexpensive device, even in a case of not just after heat seal, in a seal failure inspection method of a container using an infrared ray.
A seal part of a sample container is irradiated with an infrared ray having the wavelength of 1,450±20 nm from a projector 7, and the transmitted or reflected infrared ray is received by a light receiver 8, and transmitted to a photodetector 10 through an optical fiber 9, to thereby output a voltage in proportion to the quantity of the infrared ray, and the output voltage is converted into an analog voltage value by a smoothing circuit board 11 and sent to a control apparatus 12. A threshold for the analog voltage value is set beforehand, and the seal part of a container which is an inspection object is irradiated with an infrared ray having the same quantity as the case of the sample container, and the received infrared ray is converted into an analog voltage value and sent to the control apparatus 12. When the analog voltage value is reduced to be smaller than the threshold set beforehand for the sample container, the seal is determined to be defective.
YAMAUCHI TOMIO
KAWAZOE AKIRA
TAKATOMI TETSUYA
| JPH11160185A | 1999-06-18 | |||
| JP2007071568A | 2007-03-22 | |||
| JP2002214361A | 2002-07-31 |