Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2011117864
Kind Code:
A
Abstract:
To provide a semiconductor device that executes burn-in test, and facilitates specifying the time of execution of burn-in test, information indicating the quality of a local host.
The semiconductor device 1 includes both a storage 2 for storing specific information for specifying the time of executed burn-in test and a controller 3 which stores specific information in the storage 2 and reading stored specific information.
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Inventors:
KAWAKAMI MAKOTO
Application Number:
JP2009276312A
Publication Date:
June 16, 2011
Filing Date:
December 04, 2009
Export Citation:
Assignee:
ELPIDA MEMORY INC
International Classes:
G01R31/26; G01R31/28; H01L21/822; H01L27/04
Attorney, Agent or Firm:
Akio Miyazaki
Ishibashi Masayuki
Masaaki Ogata
Ishibashi Masayuki
Masaaki Ogata
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