To provide a semiconductor device that allows preventing the occurrence of voids in a sealing layer.
A semiconductor device 1 includes a wiring board 2 and a semiconductor chip 3 connected to a first surface 2a of the wiring board 2 so that its function surface 3a is faced to the first surface 2a. On the first surface 2a of the wiring board 2, a rectangular connection pad is formed, the wiring board 2 and the semiconductor chip 3 are bonded by a connection member 5 connected to the connection pad so as to maintain a predetermined interval, and they are electrically connected to each other. On the first surface 2a of the wiring board 2, a solder resist film 6 is formed. In the solder resist film 6, an opening 6a having a larger size than the semiconductor chip 3, namely, formed so that the semiconductor chip 3 is entirely included therein, is provided in a planar view vertically looking down the surface 2a. A step is not formed in the opening 6a except for a step provided on the first surface 2a of the wiring board 2 and formed by wiring connected to the connection member 5.
MIYATA OSAMU
JPH09153519A | 1997-06-10 | |||
JPH11214586A | 1999-08-06 | |||
JPH06283561A | 1994-10-07 | |||
JP2002043352A | 2002-02-08 | |||
JP2004014651A | 2004-01-15 | |||
JP2001185653A | 2001-07-06 |
WO2009116202A1 | 2009-09-24 |
Mio Kawasaki
Kyoumura Junji
Next Patent: MULTILAYER CERAMIC CIRCUIT SUBSTRATE AND MANUFACTURING METHOD