To provide a semiconductor element which is capable of maintaining stable current-voltage characteristic in an input pad peripheral circuit part during open/short inspection.
This semiconductor element comprises a first n-well 20 and a second n-well 30, which are separated and formed in a horizontal direction on the lower surface of element isolating regions (a) and (b), a p-channel transistor Q2 formed inside the second n-well 30 and an input protection transistor Q1, which is separated and formed in a horizontal direction to the first n-well 20 and the element isolation region (a) on a side opposite to the second n-well 30 and it comprises a guard ring formed in a boundary surface, on a semiconductor board existing between the input protection transistor Q1 and the first n-well 20.
Next Patent: SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF