Title:
SEMICONDUCTOR MEMORY
Document Type and Number:
Japanese Patent JP2002367398
Kind Code:
A
Abstract:
To shorten a time required for a test by widening an application range of a parallel test.
In a semiconductor memory provided with memory cell sections (5-A, 5-B), the device is provided with column control means (1-4) activating simultaneously a plurality of columns retracted by shrinking and replaced in a column redundancy replacement, and data read-out means (6-A, 6-B, SDBP-B0, SDBP-B1, 9) reading out simultaneously data from a plurality of memory cells selected by the plurality of columns.
Inventors:
KUROKI KOJI
NOGUCHI HIDEKAZU
NOGUCHI HIDEKAZU
Application Number:
JP2001169578A
Publication Date:
December 20, 2002
Filing Date:
June 05, 2001
Export Citation:
Assignee:
OKI ELECTRIC IND CO LTD
International Classes:
G11C11/401; G11C29/04; G11C29/28; G11C29/34; (IPC1-7): G11C29/00; G11C11/401
Attorney, Agent or Firm:
Maeda Minoru (1 person outside)
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