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Title:
SURFACE STATE JUDGING DEVICE
Document Type and Number:
Japanese Patent JP2001051060
Kind Code:
A
Abstract:

To provide an accurate surface state judging device by using one optical system for reducing the size of a judging device and the cost, and at the same time, omitting the correction processing.

The surface state judging device includes a light emission part 201 that emits pulse laser, a scan part 301 that performs the scanning of the pulse laser from the light emission part 201, a light reception part 215 that receives reflected light, a distance measurement part 303 that measures the distance to an irradiation point, a reflection level measurement part 305 that measures a reflection level, a control part 307 that controls the light emission and scan parts 201 and 301, a data table 311 that records the distance to a target point and a surface state to the reflection level, and a judgment processing part 309 that refers to the data table 311 for judging the surface state based on data from the distance measurement and reflection level measurement parts 303 and 305.


Inventors:
MORII MIYOSHI
YASUO HIROYUKI
Application Number:
JP22936099A
Publication Date:
February 23, 2001
Filing Date:
August 13, 1999
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES
International Classes:
G01B11/00; G01N21/47; G01S17/88; G01S17/95; G01W1/00; G08G1/00; (IPC1-7): G01S17/88; G01B11/00; G01N21/47; G01W1/00; G08G1/00
Attorney, Agent or Firm:
Fukami Hisaro (2 outside)