Title:
測量システム
Document Type and Number:
Japanese Patent JP6994879
Kind Code:
B2
Abstract:
Provided is a survey system capable of more highly accurately obtaining a product of a three-dimensional survey. A survey system (1, 1', 1") includes a mobile body (2), a scanner (3) including an emitting unit (3a) configured to emit a distance measuring light (3h'), a light receiving unit (3b) configured to receive a reflected distance measuring light (31'), a distance measuring unit (3c) configured to perform a distance measurement based on an output of the light receiving unit, a first optical axis deflecting unit (3f, 3g) disposed on an optical axis (3h) of the distance measuring light and configured to deflect the distance measuring light, a second optical axis deflecting unit (3j, 3k) disposed on a light receiving optical axis (31) of the reflected distance measuring light and configured to deflect the reflected distance measuring light at the same angle in the same direction as those of the first optical axis deflecting unit, and an emitting direction detecting unit (3m) configured to detect a deflection angle and a direction of the first optical axis deflecting unit and the second optical axis deflecting unit, a posture detecting device (5, 13) configured to detect a posture of the scanner, and a position measuring device (4, 20) configured to measure a position of the scanner.
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Inventors:
Nobuyuki Nishida
Application Number:
JP2017179701A
Publication Date:
February 04, 2022
Filing Date:
September 20, 2017
Export Citation:
Assignee:
Topcon Co., Ltd.
International Classes:
G01C7/04; B64C27/08; B64D47/08; G01C15/00
Domestic Patent References:
| JP2017144784A | ||||
| JP2016151422A | ||||
| JP2014145784A | ||||
| JP2017020972A |
Foreign References:
| US20170122736 |
Attorney, Agent or Firm:
Yagi Hideto
Yu Ota
Yu Ota