Title:
TEST UNIT FOR SEMICONDUCTOR INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPS5436149
Kind Code:
A
Abstract:
PURPOSE: To enable to measure the result of bonding connection in a short time, by simultaneously detecting the voltage for all the electrodes other than the common electrode of a plurality of circuit elements.
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Inventors:
YAMAGUCHI TAKASHI
SUZUKI KOUICHI
SUZUKI KOUICHI
Application Number:
JP10294577A
Publication Date:
March 16, 1979
Filing Date:
August 26, 1977
Export Citation:
Assignee:
NIPPON ELECTRIC CO
International Classes:
G01R31/26; (IPC1-7): G01R31/26