Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
THREE-DIMENSIONAL MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP3878033
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To provide a three-dimensional measuring apparatus which can shorten a time required for measuring in the case of measuring by using a three- dimensional shape of an object to be measured.
SOLUTION: A printing state examining apparatus 1 has a table for placing a printed board K printed by a cream solder H, an illuminator 3 for constituting an illuminating means for illuminating three optical component patterns of sine wave states having different phases with respect to a surface of the printed board K, and a CCD camera 4 for constituting an imaging means for imaging an illuminated part on the board K. A controller 7 obtains a chart showing a relationship between an intensity of each optical component from the image data of the board K of a plane from the data obtained by the illumination of the illuminator 3 and coordinates, and calculates mutual relative phase angles. A height of the solder H is calculated from the obtained image data and the calculated relative phase angle by using a phase shifting method.


Inventors:
Takahiro Mamiya
Ikuo Nimura
Application Number:
JP2002053144A
Publication Date:
February 07, 2007
Filing Date:
February 28, 2002
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
CKD Corporation
International Classes:
G01B11/24; G01B11/25; (IPC1-7): G01B11/24; G01B11/25
Domestic Patent References:
JP200248523A
Attorney, Agent or Firm:
Mitsuo Kawaguchi