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Title:
X-RAY INSPECTION APPARATUS
Document Type and Number:
Japanese Patent JP2010266359
Kind Code:
A
Abstract:

To achieve an X-ray inspection apparatus capable of positioning a transfer mechanism in a width direction so that a workpiece can be accurately transferred to a prescribed inspection position between an X-ray irradiation unit and an X-ray detection unit.

The X-ray inspection apparatus 100 includes an apparatus casing 2 supported by a leg 1, the X-ray irradiation unit 3, the X-ray detection unit 4, a frame 5, the transfer mechanism 6, a cover 7, a curtain 8, a positioning mechanism, and a support mechanism. The positioning mechanism includes a turning member 12, an substantially U-shaped rod-like member, having both tips connected to a pair of supporting members 10 and 11 provided for the apparatus casing 2 and turnable with the supporting members 10 and 11 as shafts. The positioning mechanism includes supports 17 and 18 provided for the leg 1 which supports the apparatus casing 2 for supporting ends of the turning member 12. The turning member 12 is constituted in such a way as to be in contact with the free-end side of the housing 6a of the transfer mechanism 6 to perform positioning.

COPYRIGHT: (C)2011,JPO&INPIT


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Inventors:
KOMORI HARUHIKO
TATSUOKA MASAHIKO
KABUMOTO TAKASHI
TAKIGAWA TADASHI
Application Number:
JP2009118565A
Publication Date:
November 25, 2010
Filing Date:
May 15, 2009
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO
International Classes:
G01N23/04
Domestic Patent References:
JP3112418Y
JP4156572B22008-09-24
JP3113068Y
Attorney, Agent or Firm:
Patent Business Corporation Claire Patent Office