Title:
An electromagnetism noise analysis method and a device
Document Type and Number:
Japanese Patent JP5977962
Kind Code:
B2
Abstract:
An object of the present invention is to provide an EMC design technique of a device including an electronic device mounted therein for implementing noise amount analysis of a system in which individual electronic devices are combined. A housing model is acquired, component models are selected and acquire, the acquired component models are connected using a wire, the acquired component models are arranged in the acquired housing model, the arranged component models connected using the wire is driven to generate electromagnetic noise from the component models and the wire, the generated electromagnetic noise is propagated in the housing model to calculate a noise amount, and an output process of outputting data of the calculated noise amount is performed. Thus, even in the system in which a plurality of electronic devices are combined, electromagnetic noise analysis of the system can be easily performed, and a noise reduction design can be supported.
Inventors:
Hiroki Funato
Taku Suga
Yoshie Tsuchie
Satoshi Nakamura
Taku Suga
Yoshie Tsuchie
Satoshi Nakamura
Application Number:
JP2012051146A
Publication Date:
August 24, 2016
Filing Date:
March 08, 2012
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G06F17/50; G01R29/08
Domestic Patent References:
| JP201113833A | ||||
| JP2010198201A | ||||
| JP20036260A | ||||
| JP2005339003A |
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki
Yuji Toda
Shigemi Iwasaki