APERTURE DIFFRACTION INTERFEROMETER (ADI) FOR THE INSPECTION AND MEASUREMENT OF OPHTHALMIC OPTICAL COMPONENTS

WIPO Patent Application WO2006070037

A3

The invention relates to an aperture diffraction interferometer (ADI) for the inspection and measurement of ophthalmic optical components. The invention comprises: a radiation source (1), a lens system (3), a support that is suitable for any type of ophthalmic component being tested (4), a focusing lens (5), a semi-transparent sheet comprising an aperture (6), and an image-acquisition system (10). The aforementioned aperture generates a quasi-spherical reference wave which interferes with the portion of the beam that passes outside same. The interference pattern provides the optical characteristics of the component, including defects. The inventive interferometer is robust and can be easily aligned owing to the fact that the size of the aperture in the semi-transparent sheet is greater than that defined by diffraction of the wave incident thereon.

ACOSTA PLAZA EVA (ES)
CHAMADOIRA HERMIDA SARA (ES)

PCT/ES2005/000709

August 03, 2006

December 21, 2005

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UNIV SANTIAGO COMPOSTELA (ES)
ACOSTA PLAZA EVA (ES)
CHAMADOIRA HERMIDA SARA (ES)

G03F7/20

US6307635B1	2001-10-23
US5835217A	1998-11-10

HIDEO FURUHASHI ET AL.: "A point diffraction interferometer with random-dot filter", OPTICS COMMUNICATIONS, vol. 237, 2004, pages 17 - 24, XP004514716
KATSURU OTAKI ET AL.: "Absolute measurement of spherical surface by point diffraction interferometer", SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, vol. 3740, 1999, pages 602 - 605, XP008119371
See also references of EP 1832930A4

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