Title:
APPEARANCE INSPECTION DEVICE AND METHOD FOR GENERATING APPEARANCE INSPECTION IDENTIFIER
Document Type and Number:
WIPO Patent Application WO/2024/111678
Kind Code:
A1
Abstract:
Provided are an appearance inspection device and a method for generating an appearance inspection identifier that improve the assessment precision of inspections. An appearance inspection device according to the present invention generates at least one simulated image that approximates an appearance inspection assessment standard for conforming articles and non-conforming articles on the basis of a non-conforming article image that includes a defect for which a non-conforming article determination would be made during appearance inspection. The appearance inspection device comprises: a storage unit that stores boundary learning results obtained by machine learning of the boundary between conforming articles and non-conforming articles using pairs of a non-conforming article image and a simulated image or pairs of two simulated images; and an inspection unit that inspects the surface of an object under inspection on the basis of the boundary learning results.
Inventors:
SEKI TAKATERU (JP)
ONOZUKA HIDEAKI (JP)
ICHINOSE MASATOSHI (JP)
WATANABE TAKASHI (JP)
ONOZUKA HIDEAKI (JP)
ICHINOSE MASATOSHI (JP)
WATANABE TAKASHI (JP)
Application Number:
PCT/JP2023/046549
Publication Date:
May 30, 2024
Filing Date:
December 26, 2023
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
G01N21/88; G06N20/00; G06T7/00; G06V10/778
Domestic Patent References:
| WO2021161853A1 | 2021-08-19 |
Foreign References:
| JP2022169974A | 2022-11-10 | |||
| JP2011214903A | 2011-10-27 |
Attorney, Agent or Firm:
YAMAMOTO, Osamu et al. (JP)
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