Title:
BASE MATERIAL FOR DETECTING CHIRAL COMPOUND
Document Type and Number:
WIPO Patent Application WO/2020/113723
Kind Code:
A1
Abstract:
A base material for detecting a chiral compound. The base material is used in conjunction with a Raman spectrometer to detect the chiral compound; the base material is a surface plasmon resonance material having chirality. The base material can perform specific Raman scattering signal enhancement on the chiral compound, and has different enhancement degrees for different enantiomers, and therefore, the content ratio of the enantiomer of the base material may be calculated by means of characteristic peak intensity in a Raman spectrum. Compared with a detection means in the prior, the detection of the chiral compound can be realized by using the base material and combining the Raman spectrometer, and the present invention has the advantages, such as low costs, simple operation, little interference, accurate results, and wide application.
Inventors:
CHE SHUNAI (CN)
LIU ZEXI (CN)
DUAN YINGYING (CN)
LIU ZEXI (CN)
DUAN YINGYING (CN)
Application Number:
PCT/CN2018/124279
Publication Date:
June 11, 2020
Filing Date:
December 27, 2018
Export Citation:
Assignee:
UNIV TONGJI (CN)
International Classes:
G01N21/65; B22F9/16; B22F9/24; B82Y40/00; G02B5/00
Domestic Patent References:
| WO2007134446A1 | 2007-11-29 |
Foreign References:
| CN101776604A | 2010-07-14 | |||
| CN101865841A | 2010-10-20 | |||
| CN105259157A | 2016-01-20 | |||
| CN101695756A | 2010-04-21 |
Attorney, Agent or Firm:
SHANGHAI DANRONG & ZONGDE INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)
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