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Title:
CHARGED PARTICLE OPTICAL SYSTEM AND CHARGED PARTICLE APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/230717
Kind Code:
A1
Abstract:
A charged particle optical system comprising: a permanent magnetic lens which, with respect to an optical axis direction of the charged particle optical system, is disposed on the object side of a central point between a charged particle beam source and an object; an electromagnetic lens which, with respect to the optical axis direction of the charged particle optical system, is disposed with at least a part thereof positioned to overlap the permanent magnetic lens; and an electrostatic lens which, with respect to the optical axis direction of the charged particle optical system, is disposed with at least a part thereof positioned to overlap at least one of the permanent magnetic lens and the electromagnetic lens.

Inventors:
GOTO TAKAKUNI (JP)
ISHIKAWA MOTOFUSA (JP)
OGASAWARA BAKU (JP)
KUSU SHUNTA (JP)
KOMATSU YUTA (JP)
UCHIDA TOMOYA (JP)
Application Number:
PCT/JP2022/018129
Publication Date:
November 03, 2022
Filing Date:
April 19, 2022
Export Citation:
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Assignee:
NIKON CORP (JP)
International Classes:
H01J37/143; H01J37/145
Domestic Patent References:
WO2012057166A12012-05-03
Foreign References:
JPS5914242A1984-01-25
US20200161079A12020-05-21
JP2021075751A2021-05-20
US9472372B22016-10-18
Other References:
YURI YOSUKE, FUKUDA MITSUHIRO, YUYAMA TAKAHIRO: "Formation of hollow ion beams of various shapes using multipole magnets", PROGRESS OF THEORETICAL AND EXPERIMENTAL PHYSICS, vol. 2019, no. 5, 1 May 2019 (2019-05-01), pages 1 - 11, XP055981511, DOI: 10.1093/ptep/ptz024
Attorney, Agent or Firm:
NISHIZAWA Kazuyoshi et al. (JP)
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