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Patent Searching and Data


Title:
COMPOSITION FOR UNDERLAYER FILM FORMATION, UNDERLAYER FILM, AND LITHOGRAPHY PROCESS
Document Type and Number:
WIPO Patent Application WO/2022/039082
Kind Code:
A1
Abstract:
The present invention provides a composition for underlayer film formation having excellent alignment orientation of phase-separated structures as achieved via self-organization, an underlayer film of a self-organizing film, and a self-organized lithography process. A composition for underlayer film formation of a self-organized film in a self-organized lithography process, wherein the composition for underlayer film formation contains a solvent and a polymer (1) having a partial structure represented by formula (1). (In formula (1), X is a hydrogen atom, a halogen atom, a hydroxyl group, a C1-5 alkyl group, a C1-5 hydroxyalkyl group, or a C1-5 halogenated alkyl group, etc.)

Inventors:
TAMADA MIKI (JP)
KUMEGAWA RYO (JP)
SHIRATANI MOTOHIRO (JP)
KOMATSU HIROYUKI (JP)
MARUYAMA KEN (JP)
OSAWA SOSUKE (JP)
Application Number:
PCT/JP2021/029616
Publication Date:
February 24, 2022
Filing Date:
August 11, 2021
Export Citation:
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Assignee:
JSR CORP (JP)
International Classes:
C08F8/00; C08F120/10; H01L21/027
Domestic Patent References:
WO2005013601A12005-02-10
Foreign References:
JP2012061531A2012-03-29
JP2012062365A2012-03-29
JP2010237491A2010-10-21
JP2010113035A2010-05-20
JP2008036491A2008-02-21
JP2016117865A2016-06-30
JP2018538382A2018-12-27
US20140193614A12014-07-10
JP2016161886A2016-09-05
Attorney, Agent or Firm:
UNIUS PATENT ATTORNEYS OFFICE (JP)
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