Title:
COUPLED ETALON INTERFEROMETERS
Document Type and Number:
WIPO Patent Application WO2000042380
Kind Code:
A8
Abstract:
Light introduced at a first off-axis point (502') on the image plane (503) is partially transmitted through the interferometer (510) to the detector (512) and partially reflected to a second off-axis point (502'') on the image plane. The reflected light is guided to a third off-axis point (504') on the image plane for retransmission back through the interferometer to a different point on the detector. A plurality of optical fibers (504, 506) are employed, each having one end to receive light at an off-axis point of the image plane, and another end to re-direct the light back through the etalon (510) from a different off-axis point of the image plane.
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Inventors:
HAYS PAUL B
Application Number:
PCT/US2000/000610
Publication Date:
August 17, 2000
Filing Date:
January 11, 2000
Export Citation:
Assignee:
HAYS FISK MOORE LLC (US)
International Classes:
G01B9/02; G01J3/26; (IPC1-7): G01B9/02
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