Title:
METHOD, DEVICE, AND SYSTEM FOR MEASURING NONLINEARITY-RELATED PARAMETER OF NONLINEAR APPARATUS
Document Type and Number:
WIPO Patent Application WO/2022/088048
Kind Code:
A1
Abstract:
Embodiments of the present application provide a method, device, and system for measuring a nonlinearity-related parameter of a nonlinear apparatus. The device comprises: a first processing unit, for performing band-stop filtering on a signal to be measured, generating a band-notch signal, and calculating, according to a first output signal of the nonlinear apparatus after the band-notch signal is inputted to the nonlinear apparatus, a first nonlinearity-related parameter of the nonlinear apparatus when transmitting the signal to be measured; a second processing unit, for calculating a gain compression correction factor according to a second output signal of the nonlinear apparatus after a first input signal is inputted to the nonlinear apparatus, the first input signal and the signal to be measured having the same power and different signal probability distributions; and a third processing unit, for correcting the first nonlinearity-related parameter according to the gain compression correction factor, to obtain a second nonlinearity-related parameter of the nonlinear apparatus when transmitting the signal to be measured.
Inventors:
YE TONG (CN)
TAO ZHENNING (CN)
SU XIAOFEI (CN)
YANG CHENGWU (CN)
TAO ZHENNING (CN)
SU XIAOFEI (CN)
YANG CHENGWU (CN)
Application Number:
PCT/CN2020/125281
Publication Date:
May 05, 2022
Filing Date:
October 30, 2020
Export Citation:
Assignee:
FUJITSU LTD (JP)
YE TONG (CN)
TAO ZHENNING (CN)
SU XIAOFEI (CN)
YANG CHENGWU (CN)
YE TONG (CN)
TAO ZHENNING (CN)
SU XIAOFEI (CN)
YANG CHENGWU (CN)
International Classes:
H04L25/49; H04B10/116
Foreign References:
| CN111245512A | 2020-06-05 | |||
| CN111800194A | 2020-10-20 | |||
| US20110163806A1 | 2011-07-07 | |||
| US20110187455A1 | 2011-08-04 |
Attorney, Agent or Firm:
BEIJING SANYOU INTELLECTUAL PROPERTY AGENCY LTD. (CN)
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