Title:
METHOD FOR MEASURING DECENTRALIZATION OF OPTICAL AXIS ON THE FRONT AND THE REAR SURFACE OF LENS
Document Type and Number:
WIPO Patent Application WO/2007/018118
Kind Code:
A1
Abstract:
A laser probe is used to measure a cross sectional shape in a first and a second direction
at each of apexes at the front and the rear surface of an aspheric lens. The measured
cross sectional shape of the front and the rear surface of the aspheric lens is
described in a common coordinate system decided according to the 3D position
of the measured pin hole (common reference point). According to the measured
cross sectional shape, each of the apexes is detected so as to obtain the relative
decentralization amount of the front and the rear surface of the aspheric lens
with accuracy in the order of micrometers or below.
Inventors:
NAKAMURA KATSUSHIGE
MIURA KATSUHIRO
MIURA KATSUHIRO
Application Number:
PCT/JP2006/315396
Publication Date:
February 15, 2007
Filing Date:
August 03, 2006
Export Citation:
Assignee:
MITAKA KOKI KK (JP)
NAKAMURA KATSUSHIGE
MIURA KATSUHIRO
NAKAMURA KATSUSHIGE
MIURA KATSUHIRO
International Classes:
G01B11/24; G01B11/00; G01M11/00
Foreign References:
| JP2001324309A | 2001-11-22 | |||
| JP2004028672A | 2004-01-29 | |||
| JP2003083739A | 2003-03-19 |
Attorney, Agent or Firm:
MIYOSHI, Hidekazu et al. (2-8 Toranomon 1-chom, Minato-ku Tokyo 01, JP)
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