Title:
MICROARRAY DEVICE, METHOD FOR MANUFACTURING MICROARRAY DEVICE, INSPECTION KIT, INSPECTION SYSTEM, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/116670
Kind Code:
A1
Abstract:
The present invention addresses the problem of providing: a microarray device with which it is possible to quickly generate a large quantity of scientific data relating to a substance or object; a method for manufacturing the microarray device; and an inspection kit, an inspection system, and an inspection method in which the microarray device is used. A microarray device according to the present invention has a plurality of microdot light-emitting units that are two-dimensionally arranged, and a plurality of microwell structure parts that are two-dimensionally arranged.
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Inventors:
OIKAWA KAZUHIRO (JP)
MINAMI HARUKI (JP)
HITOSUGI SHUMPEI (JP)
TAKASHIMA NOBUHIKO (JP)
FURUKAWA SHUN (JP)
OZEKI HIDEKANE (JP)
TAKA HIDEO (JP)
KITA HIROSHI (JP)
MINAMI HARUKI (JP)
HITOSUGI SHUMPEI (JP)
TAKASHIMA NOBUHIKO (JP)
FURUKAWA SHUN (JP)
OZEKI HIDEKANE (JP)
TAKA HIDEO (JP)
KITA HIROSHI (JP)
Application Number:
PCT/JP2023/038711
Publication Date:
June 06, 2024
Filing Date:
October 26, 2023
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N21/64; G01N21/03
Domestic Patent References:
| WO2020054562A1 | 2020-03-19 | |||
| WO2021111898A1 | 2021-06-10 | |||
| WO2021202264A1 | 2021-10-07 | |||
| WO2023171738A1 | 2023-09-14 |
Foreign References:
| JP2021533830A | 2021-12-09 | |||
| JP2022099677A | 2022-07-05 | |||
| JP2018516541A | 2018-06-28 | |||
| JP2016534723A | 2016-11-10 | |||
| JP2002189026A | 2002-07-05 |
Attorney, Agent or Firm:
KOYO INTERNATIONAL PATENT FIRM (JP)
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