Title:
NON-INVASIVE MATERIAL ANALYZER
Document Type and Number:
WIPO Patent Application WO/2023/157163
Kind Code:
A1
Abstract:
This non-invasive material analyzer (1) comprises an optical waveguide circuit (10), a probe light source (26), and a light intensity detector (30). The optical waveguide circuit (10) has a sample placement area (19). The probe light source (26) emits probe light (27). The optical waveguide circuit (10) includes: a first optical waveguide (11) upon which the probe light (27) is incident; a waveguide ring resonator (12); and a second optical waveguide (13). The light intensity detector (30) detects the intensity of first light (27a) of the probe light (27), the first light being optically coupled to the second optical waveguide (13).
Inventors:
HAYASHI SHUSAKU (JP)
AKIYAMA KOICHI (JP)
TSUDA YUKI (JP)
AKIYAMA KOICHI (JP)
TSUDA YUKI (JP)
Application Number:
PCT/JP2022/006341
Publication Date:
August 24, 2023
Filing Date:
February 17, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01N25/20; G01N21/41
Foreign References:
| JP2022506275A | 2022-01-17 | |||
| JP2003527625A | 2003-09-16 | |||
| JP2015502539A | 2015-01-22 | |||
| US20180330946A1 | 2018-11-15 | |||
| US20140321502A1 | 2014-10-30 | |||
| JP6786027B1 | 2020-11-18 |
Other References:
SINGHA SATYABRATA; BHOWMIK BISHANKA BRATA: "On-chip Photonic Temperature Sensor Using Micro Ring Resonator", 2018 FIFTEENTH INTERNATIONAL CONFERENCE ON WIRELESS AND OPTICAL COMMUNICATIONS NETWORKS (WOCN), IEEE, 2 February 2018 (2018-02-02), pages 1 - 4, XP033460756, DOI: 10.1109/WOCN.2018.8556121
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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