Title:
NON-INVASIVE SUBSTANCE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/157164
Kind Code:
A1
Abstract:
This non-invasive substance analysis device (1) comprises a sample support plate (10), an excitation light source (20), and temperature sensors (25, 26). The sample support plate (10) has a primary surface (10a) that includes a sample placement region (12), and a primary surface (10b) on the side opposite the primary surface (10a). The temperature sensors (25, 26) are provided on the primary surface (10a). A through-hole (13) that extends from the sample placement region (12) to the primary surface (10b) is provided in the sample support plate (10). Excited light (21) emitted by the excitation light source (20) passes through the through-hole (13) and irradiates a sample (15) placed on the sample placement region (12).
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Inventors:
TSUDA YUKI (JP)
HAYASHI SHUSAKU (JP)
AKIYAMA KOICHI (JP)
HAYASHI SHUSAKU (JP)
AKIYAMA KOICHI (JP)
Application Number:
PCT/JP2022/006342
Publication Date:
August 24, 2023
Filing Date:
February 17, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01N25/20
Domestic Patent References:
| WO2021176583A1 | 2021-09-10 | |||
| WO2021131126A1 | 2021-07-01 | |||
| WO2016117520A1 | 2016-07-28 |
Foreign References:
| JP2019507320A | 2019-03-14 | |||
| JP2008232893A | 2008-10-02 | |||
| JP2020154105A | 2020-09-24 | |||
| JP2019507319A | 2019-03-14 | |||
| US20210401291A1 | 2021-12-30 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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