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Patent Searching and Data


Title:
POWER QUALITY MEASURING DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2012/002617
Kind Code:
A1
Abstract:
The present invention relates to a power quality measuring device and method. The power quality measuring device includes: a detection unit obtaining a voltage waveform signal and a current waveform signal at a time interval set in a power system to sample the signals at a preset sampling period; a signal converting unit converting the sampled voltage waveform signal and current waveform signal from analog signals into digital signals; a calculation unit overlapping the converted voltage waveform and current waveform signals of the digital signal to generate a representative waveform signal, performing Fast Fourier Transform (FFT) on the representative waveform signal to decompose it into a fundamental wave and a harmonic wave for each degree, and calculating a total harmonic distortion (THD) by using the basic wave signal and the harmonic wave signal for each degree to compare the THD with a predetermined harmonic distortion reference value; and a communication unit externally transmitting the total harmonic distortion.

Inventors:
PARK YOUNG UP (KR)
LEE KEON HANG (KR)
KIM SEOK GON (KR)
LEE BYUNG SUNG (KR)
KIM SANG JUN (KR)
CHOI SEONG HOON (KR)
Application Number:
PCT/KR2010/006564
Publication Date:
January 05, 2012
Filing Date:
September 28, 2010
Export Citation:
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Assignee:
KOREA ELECTRIC POWER CORP (KR)
PARK YOUNG UP (KR)
LEE KEON HANG (KR)
KIM SEOK GON (KR)
LEE BYUNG SUNG (KR)
KIM SANG JUN (KR)
CHOI SEONG HOON (KR)
International Classes:
G01R23/16; G01R35/02
Foreign References:
KR100313830B12001-11-15
JP2004198273A2004-07-15
KR100813663B12008-03-14
Attorney, Agent or Firm:
EZ INTERNATIONAL (KR)
특허법인이지 (KR)
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Claims: