Title:
SPECTRAL MEASUREMENT APPARATUS AND MEASUREMENT METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2023/284570
Kind Code:
A1
Abstract:
The present disclosure relates to a spectral measurement apparatus and a spectral measurement method thereof. The spectral measurement apparatus comprises: a plurality of first light-emitting units (11), wherein each first light-emitting unit is suitable for emitting light having a first emission spectrum within a first band range, the first emission spectrums of light emitted by any two first light-emitting units are not related to each other, and the plurality of first light-emitting units can be operated to emit, in a time-sharing manner and to an object to be measured, light having corresponding first emission spectrums; a first single-point light detector (15), which is suitable for respectively detecting the intensity of light, which is emitted by each first light-emitting unit and is reflected by said object; and a computing apparatus, which is suitable for determining a first reflectivity spectrum of said object within the first band range on the basis of a plurality of first emission spectrums and corresponding detected light intensities.
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Inventors:
WANG ZHENWEI (CN)
Application Number:
PCT/CN2022/103489
Publication Date:
January 19, 2023
Filing Date:
July 01, 2022
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G01J3/28; G01N21/27
Domestic Patent References:
WO2021041948A1 | 2021-03-04 | |||
WO2021096648A1 | 2021-05-20 |
Foreign References:
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CN202110808422A | 2021-07-16 |
Attorney, Agent or Firm:
KING & WOOD MALLESONS (CN)
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