Title:
SYSTEM AND METHOD FOR MEASURING WAVE DIRECTIONAL SPECTRUM AND WAVE HEIGHT
Document Type and Number:
WIPO Patent Application WO2000020893
Kind Code:
A9
Abstract:
A system and method for measuring the directional spectrum of one or more waves in a fluid medium using a multi-beam sonar system (100). In an exemplary embodiment, range cells located within a plurality of acoustic beams (104) are sampled to provide current velocity data. Optionally, wave surface height and pressure data is obtained as well. This velocity, wave height, and pressure data is Fourier-transformed by one or more signal processors (178) within the system (100), and a surface height spectrum produced. A cross-spectral coefficient matrix at each observed frequency is also generated from this data. A sensitivity vector specifically related to the ADCP's transducer array (103) geometry is used in conjunction with maximum likelihood method (MLM), iterative maximum likelihood method (IMLM), or other similar methods to solve the wave equation at each frequency and produce a frequency-specific wave directional spectrum. Ultimately, the frequency-specific spectra are combined to construct a complete two-dimensional wave directional spectrum. The system (100) is also capable of measuring current profile as a function of depth in conjunction with wave direction and wave height.
Inventors:
BRUMLEY BLAIR H
TERRAY EUGENE A
STRONG BRANDON S
TERRAY EUGENE A
STRONG BRANDON S
Application Number:
PCT/US1999/017619
Publication Date:
August 31, 2000
Filing Date:
August 04, 1999
Export Citation:
Assignee:
ROWE DEINES INSTR (US)
International Classes:
G01C13/00; G01S7/526; G01S15/58; G01S15/62; (IPC1-7): G01S15/58; G01C13/00
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