Title:
TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2010/125712
Kind Code:
A1
Abstract:
Provided is an arrangement wherein temperatures are measured with high accuracy in a temperature measurement system and a temperature measurement method. The aforementioned arrangement is such that a temperature measurement system is used wherein are provided a laser beam source (21) which outputs laser beams, optical fiber (24) installed in a temperature measurement area, and a temperature measurement portion (27) which obtains a temperature distribution regarding temperatures measured in a temperature measurement area along a route where the optical fiber (24) is installed and which corrects the aforementioned temperature distribution, thereby calculating a corrected temperature distribution. The following are performed by the temperature measurement portion (27): The transfer function of the optical fiber (24) along the installation route and the corrected temperature distribution are folded in; correction of the aforementioned measured temperature distribution is successively performed a plurality of times so that squared errors with respect to the measured temperature distribution will decrease each time that correction is performed; each time that correction is performed, the temperatures at specific points in the installation route are replaced with estimated temperatures at the aforementioned specific points.
Inventors:
KASAJIMA TAKEO (JP)
UNO KAZUSHI (JP)
TAKEI FUMIO (JP)
UNO KAZUSHI (JP)
TAKEI FUMIO (JP)
Application Number:
PCT/JP2009/071302
Publication Date:
November 04, 2010
Filing Date:
December 22, 2009
Export Citation:
Assignee:
FUJITSU LTD (JP)
KASAJIMA TAKEO (JP)
UNO KAZUSHI (JP)
TAKEI FUMIO (JP)
KASAJIMA TAKEO (JP)
UNO KAZUSHI (JP)
TAKEI FUMIO (JP)
International Classes:
G01K11/12
Foreign References:
| JP3065832B2 | 2000-07-17 | |||
| JPH05172656A | 1993-07-09 | |||
| JPH1011681A | 1998-01-16 | |||
| JP2004028748A | 2004-01-29 | |||
| JPH06109557A | 1994-04-19 |
Other References:
"Fujitsu Develops Technology Enabling Real-time Multiple-Point Temperature Measurement", 4 April 2008, FUJITSU LABORATORIES LTD.
Attorney, Agent or Firm:
OKAMOTO, KEIZO (JP)
Keizo Okamoto (JP)
Keizo Okamoto (JP)
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