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Title:
WAFER FOR TESTING
Document Type and Number:
WIPO Patent Application WO/2022/104804
Kind Code:
A1
Abstract:
The present invention provides a wafer for testing, comprising: a plurality of memory arrays, wherein at least one memory parameter between the different memory arrays is different; and a test circuit, wherein the test circuit is configured to acquire an external test command, and test the different memory arrays according to the external test command and collect test results.

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Inventors:
LIAO YUCHENG (CN)
XU CHENGYU (CN)
CHIU CHINGSUNG (CN)
Application Number:
PCT/CN2020/130936
Publication Date:
May 27, 2022
Filing Date:
November 23, 2020
Export Citation:
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Assignee:
JIANGSU ADVANCED MEMORY TECH CO LTD (CN)
JIANGSU ADVANCED MEMORY SEMICONDUCTOR LTD (CN)
SILOAM HOLDINGS CO LTD (SC)
International Classes:
G11C29/12; H01L27/24
Foreign References:
CN111527608A2020-08-11
CN102540050A2012-07-04
CN111527609A2020-08-11
CN102903392A2013-01-30
US7660173B22010-02-09
Attorney, Agent or Firm:
SHANGHAI WINSUN INTELLECTUAL PROPERTY AGENCY (CN)
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