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Patent Searching and Data


Title:
パターン認識に関する改良
Document Type and Number:
Japanese Patent JP4197844
Kind Code:
B2
Abstract:
An imaging system ( 10 ) has a fixed lens combination ( 22 ), a spatial light modulator (SLM) ( 20 ) and a linear detector array ( 12 ). A scene image is scanned across a simple array ( 12 ) in a direction perpendicular to the array ( 12 ) by the SLM ( 20 ). This is achieved by displaying a diffraction pattern on the SLM that changes to achieve the scanning. The diffraction pattern displayed typically has a linear element ( 40 ) and a quadratic element (42). By having a programmably changed combined chirp pattern ( 36 ) displayed on the SLM, and by being able to change it thousands of times a second, an army with fast read out can take the place of a 2-D imaging array.

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Inventors:
Louis Myrion Francis
Wilson Rebecca Ann
Rowans Bryan Sinclair
Young Rupert Charles David
Application Number:
JP2000571399A
Publication Date:
December 17, 2008
Filing Date:
September 24, 1998
Export Citation:
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Assignee:
QINETIQ LIMITED
International Classes:
G01B11/00; G02B13/00; G06T7/00; G02B26/08; G02B26/10; G02B27/00; G02B27/46; G02F3/00; G06T1/00; G06V10/88; H04N5/225
Domestic Patent References:
JP8129149A
JP1316787A
JP2002511942A
Attorney, Agent or Firm:
Minoru Nakamura
Fumiaki Otsuka
Sadao Kumakura
Shishido Kaichi
Hideto Takeuchi
Toshio Imajo
Nobuo Ogawa
Village shrine Atsuo
Takaki Nishijima
Atsushi Hakoda