Title:
仮組み用ワイヤ残留検出装置および仮組み用ワイヤ残留検出方法
Document Type and Number:
Japanese Patent JP5545240
Kind Code:
B2
More Like This:
JP2017517870 | Variable curvature of field for object inspection |
JPH06213643 | INTERFEROMETER DEVICE |
Inventors:
Akihiro Daito
Wood Yuichi
The west 改 Kenta
Nobuhisa Toyoda
Nagai field Saburo
Wood Yuichi
The west 改 Kenta
Nobuhisa Toyoda
Nagai field Saburo
Application Number:
JP2011035985A
Publication Date:
July 09, 2014
Filing Date:
February 22, 2011
Export Citation:
Assignee:
Denso, Inc.
International Classes:
G01B11/30; B23K1/00; G01B11/00
Attorney, Agent or Firm:
Patent business corporation ゆうあい patent firm