Title:
測定ソリューションサービス提供システム
Document Type and Number:
Japanese Patent JP6570210
Kind Code:
B2
Abstract:
To provide an epoch-making measurement solution service.SOLUTION: A measurement solution service providing system 1 comprises: a plurality of repeating devices 21 including a processor configured to collect measurement data transmitted from a plurality of measurement sources A, B and C and transmit the measurement data via a communication network 5 in order to request processing of the collected measurement data, functioning as an IoT gateway, and being arranged for each base; and a cloud computing system 3 configured to receive the measurement data transmitted from the plurality of repeating devices 21 arranged for each base, respectively, perform accumulation processing of the measurement data in a measurement database by a hierarchical structure taking a logical tree form, perform totalization and analysis processing on the measurement data subjected to accumulation processing for each base, perform totalization and analysis processing for each integration object between the bases, perform display processing of the result of the totalization and analysis processing of the measurement data, and transmit the display processing result in response to a display request.SELECTED DRAWING: Figure 1
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Inventors:
Kentaro Harada
Application Number:
JP2019036694A
Publication Date:
September 04, 2019
Filing Date:
February 28, 2019
Export Citation:
Assignee:
Teclock Smart Solutions Co., Ltd.
International Classes:
G06Q50/04
Domestic Patent References:
| JP2004133632A | ||||
| JP2013161395A |
Foreign References:
| WO2015029969A1 |
Attorney, Agent or Firm:
Tomoko Tsujida