To anneal a semiconductor film by scanning a substrate with a time modulated continuous oscillation laser beam shaped into an elongated shape at a high velocity without rotating the substrate.
A laser beam subjected to time modulation by a modulator 7 and shaped into an elongated shape by a beam shaper 10 is rotated about the optical axis of an image rotator 13 inserted between the beam shaper and the substrate thus rotating the longitudinal direction of the elongated laser beam about the optical axis on a substrate 15. At the time of annealing in the plurality of directions on the substrate 15, the laser beam shaped into an elongated shape is rotated on the substrate and a stage mounting the substrate moves only in the two directions, i.e. XY directions.
YAZAKI AKIO
HATANO MUTSUKO
HITACHI DISPLAYS LTD
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