LENS ECCENTRICITY MEASURING METHOD AND LENS ECCENTRICITY MEASURING DEVICE

Title:

LENS ECCENTRICITY MEASURING METHOD AND LENS ECCENTRICITY MEASURING DEVICE

Document Type and Number:

Japanese Patent JP2007322220

Kind Code:

A

Abstract:

To provide a lens eccentricity measuring method and a lens eccentricity measuring device, capable of measuring inclination of eccentricity of an inspection surface from the height of reflected image by the proportional coefficient, independently of the radius of curvature of the inspection surface.

The lens eccentricity measurement device 1 comprises the illumination optical system 5 for projecting the image of the light source 2 to the inspection surface 3A of the lens 3; the observation optical system 6 for observing the reflected image from the inspection surface 3A; the first moving part 7 for relatively moving the focusing position (illumination position A) of the light source 2 by the illumination optical system 5 along the light axis C1 of the illumination optical system 5 to the inspection surface 3A; the second moving part 8 for relatively moving the focus position (observation position B) of the observation optical system 6 along the optical axis C2 of the observation optical system 6 to the inspection surface 3A; the driving controller 10 for controlling the first moving part 7 and the second moving part 8; the controller 11 for controlling the device as a whole; and the base 12 for supporting the lens 3.

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