Title:
MAGNETIC PARTICLE INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2021043095
Kind Code:
A
Abstract:
To improve accuracy of magnetic particle inspection.SOLUTION: A magnetic particle inspection device 100 includes: an image acquisition unit 110 configured to acquire an image obtained by attaching magnetic particles 201 to a magnetized inspection object 200 and capturing the image of the inspection object 201, and a binarized image obtained by binarizing the image; a region specifying unit 120 configured to determine, from the image, a magnetic particle group region 203 surrounding a magnetic particle group 202 which is a block of the magnetic particles 201; and a detection unit 130 configured to detect a flaw by processing, with artificial intelligence obtained by supervised learning, luminance information obtained by performing statistical processing on luminance in the magnetic particle group region 203 and form information relating to a shape of the magnetic particle group 202 obtained from the binarized image.SELECTED DRAWING: Figure 2
Inventors:
ARAI YUKI
Application Number:
JP2019166088A
Publication Date:
March 18, 2021
Filing Date:
September 12, 2019
Export Citation:
Assignee:
JTEKT CORP
International Classes:
G01N21/91; G06V10/28; G06V10/774
Attorney, Agent or Firm:
Hiromori Arai