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Title:
X-RAY ANALYSIS DEVICE
Document Type and Number:
Japanese Patent JP3711410
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To improve the analysis accuracy by spraying the gas containing oxygen against the surface of a sample to be analyzed during the irradiation of the ultraviolet ray to surely remove the carbon substance adhered to the surface to be analyzed.
SOLUTION: A sample 1 is installed at the position opposite to a lower opening 30 of a casing 31 of an ultraviolet ray irradiation device 3, a vacuum pump 23 is driven in a condition where an opening window is closed, and a vacuum chamber 20 is evacuated until the pressure inside reaches the prescribed value for the X-ray analysis. When the pressure in the vacuum chamber reaches the prescribed value, the gas containing oxygen is sprayed between the opening 30 and a surface 10 to be analyzed of the sample 1 from a nozzle part 72 of a gas injection pipe 71, and the ultraviolet ray is irradiated from an ultraviolet ray source while increasing the oxygen concentration therearound. A large volume of ozone is generated around the surface 10 to be analyzed, i.e., the space around the surface 10 to be analyzed is in the ozone environment, the carbon substance adhered to the surface 10 to be analyzed is decomposed and evaporated and removed by the ozone and ultraviolet ray to provide the clean surface to be analyzed, and correctness and accuracy of the analysis are improved.


Inventors:
Utaka Tadashi
Application Number:
JP1004597A
Publication Date:
November 02, 2005
Filing Date:
January 23, 1997
Export Citation:
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Assignee:
Rigaku Denki Kogyo Co., Ltd.
International Classes:
G01N23/223; H01L21/304; H01L21/66; (IPC1-7): G01N23/223
Domestic Patent References:
JP59224548A
JP5288695A
JP3503662A
JP47030851Y1
Attorney, Agent or Firm:
Shuji Sugimoto
Masashi Noda