Title:
RF filter tuning system and filter manufacturing method using this
Document Type and Number:
Japanese Patent JP6325090
Kind Code:
B2
Abstract:
An automatic RF filter tuning system and a method for manufacturing a filter using the same are disclosed. An RF filter tuning system for tuning an RF filter that includes a plurality of cavities having resonance elements and a cover having tuning areas that are positioned correspondingly to the resonance elements, includes a measuring unit configured to measure resonance characteristics of the cavity of the RF filter, a control unit configured to calculate a tuning value of the RF filter based on the resonance characteristics, and a tuning unit configured to tune the RF filter based on the tuning value calculated by the control unit. The tuning unit includes a striking unit configured to strike the tuning area of the cover of the RF filter, thereby adjusting the resonance value and tuning the RF filter.
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Inventors:
Pak Nam Shin
Kim jong fee
Lee Dong Young
Soganhi
John John Yun
Cho San Juan
Kim Dong Jeong
Kim San Yun
Park Young Jin
Kim Ogwon
Kim jong fee
Lee Dong Young
Soganhi
John John Yun
Cho San Juan
Kim Dong Jeong
Kim San Yun
Park Young Jin
Kim Ogwon
Application Number:
JP2016516511A
Publication Date:
May 16, 2018
Filing Date:
March 04, 2016
Export Citation:
Assignee:
KMW INC.
International Classes:
H01P1/205
Domestic Patent References:
JP2015510353A | ||||
JP6006120A | ||||
JP6081626B2 |
Attorney, Agent or Firm:
Mitsue Obuchi
Yukio Fuse
Yukio Fuse
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