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Title:
RF filter tuning system and filter manufacturing method using this
Document Type and Number:
Japanese Patent JP6325090
Kind Code:
B2
Abstract:
An automatic RF filter tuning system and a method for manufacturing a filter using the same are disclosed. An RF filter tuning system for tuning an RF filter that includes a plurality of cavities having resonance elements and a cover having tuning areas that are positioned correspondingly to the resonance elements, includes a measuring unit configured to measure resonance characteristics of the cavity of the RF filter, a control unit configured to calculate a tuning value of the RF filter based on the resonance characteristics, and a tuning unit configured to tune the RF filter based on the tuning value calculated by the control unit. The tuning unit includes a striking unit configured to strike the tuning area of the cover of the RF filter, thereby adjusting the resonance value and tuning the RF filter.

Inventors:
Pak Nam Shin
Kim jong fee
Lee Dong Young
Soganhi
John John Yun
Cho San Juan
Kim Dong Jeong
Kim San Yun
Park Young Jin
Kim Ogwon
Application Number:
JP2016516511A
Publication Date:
May 16, 2018
Filing Date:
March 04, 2016
Export Citation:
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Assignee:
KMW INC.
International Classes:
H01P1/205
Domestic Patent References:
JP2015510353A
JP6006120A
JP6081626B2
Attorney, Agent or Firm:
Mitsue Obuchi
Yukio Fuse