Title:
INSPECTION METHOD, AND METHOD FOR MANUFACTURING IMAGING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2024/018717
Kind Code:
A1
Abstract:
This inspection method includes: a step for preparing a device provided with a plurality of pixel electrodes (11), a counter electrode (13) that is disposed facing the plurality of pixel electrodes (11), a photoelectric conversion layer (12) that is disposed between the plurality of pixel electrodes (11) and the counter electrode (13), a test electrode that faces the counter electrode (13) so as to sandwich the photoelectric conversion layer (12) and is disposed between two adjacent pixel electrodes from among the plurality of pixel electrodes, a first electrode pad that is electrically connected to the counter electrode (13) and is exposed to the exterior, and a second electrode pad that is electrically connected to the test electrode and is exposed to the exterior; and a step for applying a voltage between the first electrode pad and the second electrode pad and measuring the electric current flowing between the first electrode pad and the second electrode pad.
Inventors:
MACHIDA SHINICHI
SHISHIDO SANSHIRO
SHISHIDO SANSHIRO
Application Number:
PCT/JP2023/016527
Publication Date:
January 25, 2024
Filing Date:
April 26, 2023
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
H01L27/144; H01L27/146
Domestic Patent References:
| WO2020170702A1 | 2020-08-27 | |||
| WO2021149414A1 | 2021-07-29 |
Foreign References:
| JP2011216853A | 2011-10-27 | |||
| JP2013211291A | 2013-10-10 | |||
| US20140264505A1 | 2014-09-18 |
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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