Title:
ION ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/091674
Kind Code:
A1
Abstract:
Provided is an ion analysis device (10) that irradiates sample component-derived precursor ions with radicals so as to generate product ions and analyzes the product ions, said device comprising: a reaction chamber (142) into which the precursor ions are introduced; a radical generation unit (151) which generates radicals; and a radical transport pipe (152) which connects the radical generation unit (151) and the reaction chamber (142), wherein at least part of the inner wall surface of the radical transport pipe (152) is made of a material having a lesser amount of or lower strength of radical adherence to the inner wall surface of the radical transport pipe (152) in comparison with alumina or quartz. One end (1523) of the radical transport pipe (152) is disposed inside the reaction chamber (142) and preferably faces toward a prescribed region (1424) where ions are localized in the reaction chamber (142).
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Inventors:
FURUTA MASAJI (JP)
TAKAHASHI HIDENORI (JP)
TAKAHASHI HIDENORI (JP)
Application Number:
PCT/JP2021/035582
Publication Date:
May 05, 2022
Filing Date:
September 28, 2021
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N27/62; H01J49/00
Domestic Patent References:
| WO2020152806A1 | 2020-07-30 | |||
| WO2021053865A1 | 2021-03-25 |
Foreign References:
| JP2019164135A | 2019-09-26 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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