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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING CHEMICAL SUBSTANCE
Document Type and Number:
WIPO Patent Application WO/2001/050110
Kind Code:
A1
Abstract:
An apparatus for measuring a chemical substance which comprises a decomposition means (10) wherein a substance to be measured which is adhered to an impurity is decomposed and converted to a chemical substance characteristic to the substance to be measured, a chemical substance-measuring means (30), and a filter (50) through which the chemical substance is introduced selectively to the chemical substance-measuring means (30) and which indirectly measures the substance to be measured based on the result of the measurement of the chemical substance. The apparatus can be used for achieving the realtime measurement with high sensitivity of various chemical substances including a chemical substance formed in the form of an adherend to an impurity, e. g. dioxin.

Inventors:
MARUO KAZUYUKI (JP)
Application Number:
PCT/JP2000/007499
Publication Date:
July 12, 2001
Filing Date:
October 26, 2000
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
MARUO KAZUYUKI (JP)
International Classes:
G01N1/00; G01N1/02; G01N1/22; G01N21/27; G01N21/35; G01N21/3504; G01N21/552; G01N21/75; G01N31/00; G01N33/00; (IPC1-7): G01N1/22; G01N21/27; G01N21/35; G01N31/00
Foreign References:
EP0447158A21991-09-18
JPH10153591A1998-06-09
JPH09243601A1997-09-19
JPH112607A1999-01-06
JPH10230120A1998-09-02
JPS57111435A1982-07-10
JPH08313430A1996-11-29
US4630464A1986-12-23
JPH11281540A1999-10-15
JPH07218494A1995-08-18
Attorney, Agent or Firm:
Kitano, Yoshihito (Daikyo-cho Shinjuku-ku Tokyo, JP)
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