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Title:
荷電粒子ビーム描画装置、偏向器間のタイミング調整方法、及び偏向アンプの故障検出方法
Document Type and Number:
Japanese Patent JP5432630
Kind Code:
B2
Abstract:

To provide a device capable of regulating timing between deflectors in a short time.

The charged particle beam lithography apparatus includes a DAC amplifier unit 132 switched from the (n-1)-th beam ON to beam OFF after the first delay time from a timing signal of the n-th beam ON, the blanking deflector 212 for generating alternately the beam ON/OFF, by a deflection voltage from the DAC amplifier unit 132, a DAC amplifier unit 134 for starting a voltage change toward the n-th beam ON after the second delay time from the timing when the DAC amplifier unit 132 issues the timing signal, the deflector 205 for controlling a direction of a beam, by a deflection voltage from the DAC amplifier unit 134, and a setter 114 for setting the first delay time, to make an integrated current obtained from a correlation results between an evaluating time used in stead of the first delay time and an integrated current of a current at the beam obtained in the evaluating time, get shorter than a change start time from a fixed state of the integrated current.

COPYRIGHT: (C)2011,JPO&INPIT


Inventors:
Yoshiaki Onimaru
Kimura Hayato
Kei Hasegawa
Sengoku Yasuo
Application Number:
JP2009184473A
Publication Date:
March 05, 2014
Filing Date:
August 07, 2009
Export Citation:
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Assignee:
New Flare Technology Co., Ltd.
International Classes:
H01L21/027; H01J37/305
Domestic Patent References:
JP2016719A
JP3257916A
JP2004259812A
JP2006079911A
JP2009088202A
Attorney, Agent or Firm:
Mitsuyuki Matsuyama
Tetsuma Ikegami