Title:
METHOD FOR DEPOSITING A CHLORINE-FREE CONFORMAL SiN FILM
Document Type and Number:
Japanese Patent JP2013153164
Kind Code:
A
Abstract:
To provide methods of making silicon nitride (SiN) on substrates.
Chlorine (Cl)-free conformal SiN films are prepared by deposition. The SiN films are not only Cl-free but carbon (C)-free. Another aspect relates to methods of tuning the stress and/or the wet etch rate of the conformal SiN films. Another aspect relates to low-temperature methods of depositing high quality conformal SiN films. In some embodiments, the methods involve using trisilylamine (TSA) as a silicon-containing precursor.
More Like This:
Inventors:
DENNIS HAUSMANN
JON HENRI
BART VAN SCHRAVENDIJK
EASWAR SRINIVASAN
JON HENRI
BART VAN SCHRAVENDIJK
EASWAR SRINIVASAN
Application Number:
JP2013007612A
Publication Date:
August 08, 2013
Filing Date:
January 18, 2013
Export Citation:
Assignee:
NOVELLUS SYSTEMS INC
International Classes:
H01L21/318; C23C16/42; C23C16/505
Domestic Patent References:
JP2006060091A | 2006-03-02 | |||
JP2005210076A | 2005-08-04 | |||
JP2010283388A | 2010-12-16 | |||
JP2014532304A | 2014-12-04 | |||
JP2008517479A | 2008-05-22 |
Foreign References:
US20110256734A1 | 2011-10-20 | |||
US20110086516A1 | 2011-04-14 | |||
US20050158983A1 | 2005-07-21 | |||
US20060084283A1 | 2006-04-20 | |||
US20080260969A1 | 2008-10-23 |
Attorney, Agent or Firm:
Meisei International Patent Office
Kenichi Hori
Kenichi Hori