Title:
SEMICONDUCTOR TEST DEVICE
Document Type and Number:
Japanese Patent JP3805649
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor test device 1 capable of making a test with compact simple arrangement.
SOLUTION: A light source device 2 of this semiconductor test device 1 is provided with a pressing part 4 provided in an opposed position to a semiconductor device 5 and moved toward the semiconductor device 5 during the test to press the semiconductor device 5 to thereby perform electrical connection between the semiconductor device 5 and a socket 7.
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Inventors:
Kurasaki Shigetake
Application Number:
JP2001180625A
Publication Date:
August 02, 2006
Filing Date:
June 14, 2001
Export Citation:
Assignee:
Sharp Corporation
International Classes:
G01R31/26; H01L27/14; (IPC1-7): G01R31/26; H01L27/14
Domestic Patent References:
| JP3108677A | ||||
| JP2176583A | ||||
| JP9134767A | ||||
| JP62283689A |
Attorney, Agent or Firm:
Kenzo Hara International Patent Office
Kenzo Hara
Kenzo Hara
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