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Title:
SYSTEM, DEVICE, AND METHOD FOR DETECTING DEFECTS IN PHOTOVOLTAIC WAFER BY USING DEEP LEARNING
Document Type and Number:
WIPO Patent Application WO/2024/106684
Kind Code:
A1
Abstract:
The present invention provides a photovoltaic wafer defect detection system comprising: a photographing device that obtains a target image of a photovoltaic wafer; and a defect detection device that identifies the presence or absence of at least one defect in the photovoltaic wafer, wherein the defect detection device detects the presence or absence of defects, including a normal state of the photovoltaic wafer and a defective state including at least one defect in the photovoltaic wafer on the basis of a defect detection deep-learning model and at least one black spot present in the photovoltaic wafer on the basis of a black spot detection algorithm.

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Inventors:
KIM BYEONG GYUN (KR)
KIM MINKI (KR)
Application Number:
PCT/KR2023/010898
Publication Date:
May 23, 2024
Filing Date:
July 27, 2023
Export Citation:
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Assignee:
HANWHA SOLUTIONS CORP (KR)
International Classes:
H01L21/66; G06N3/08; G06V10/764
Foreign References:
KR20190048203A2019-05-09
KR20190075707A2019-07-01
CN108492291A2018-09-04
KR20220055082A2022-05-03
US20210364450A12021-11-25
Attorney, Agent or Firm:
THEWAVE IP LAW FIRM (KR)
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